MC9S08DZ60MLF Datasheet, PDF (390/416 Pages) Freescale Semiconductor, Inc – MC9S08DZ60 Series Features

Appendix A Electrical Characteristics
A.14 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.14.1 Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East). For more detailed information concerning the evaluation results, conditions
and setup, please refer to the EMC Evaluation Report for this device.
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
Table A-18. Radiated Emissions for 3M05C Mask Set
Parameter
Symbol Conditions
Frequency
f_osc/f_CPU
Level¹
(Max)
Unit
V_{RE_TEM}
V_DD = 5
T_A = +25^oC
64 LQFP
0.15 – 50 MHz
50 – 150 MHz
18
dBμV
18
Radiated emissions,
electric field — Conditions -
150 – 500 MHz
16 MHz
13
Crystal
500 – 1000 MHz 20 MHz Bus
7
IEC Level
L
—
SAE Level
2
—
1 _{Data based on qualification test results.}
MC9S08DZ60 Series Data Sheet, Rev. 4
390
Freescale Semiconductor