LM3S6422 Datasheet, PDF (42/609 Pages) Texas Instruments – Stellaris® LM3S6422 Microcontroller

Architectural Overview
1.4.6
1.4.6.1
1.4.6.2
1.4.7
1.4.7.1
1.4.7.2
1.4.8
Memory Peripherals
The LM3S6422 controller offers both single-cycle SRAM and single-cycle Flash memory.
SRAM (see page 225)
The LM3S6422 static random access memory (SRAM) controller supports 32 KB SRAM. The internal
SRAM of the Stellaris devices starts at base address 0x2000.0000 of the device memory map. To
reduce the number of time-consuming read-modify-write (RMW) operations, ARM has introduced
bit-banding technology in the new Cortex-M3 processor. With a bit-band-enabled processor, certain
regions in the memory map (SRAM and peripheral space) can use address aliases to access
individual bits in a single, atomic operation.
Flash (see page 226)
The LM3S6422 Flash controller supports 96 KB of flash memory. The flash is organized as a set
of 1-KB blocks that can be individually erased. Erasing a block causes the entire contents of the
block to be reset to all 1s. These blocks are paired into a set of 2-KB blocks that can be individually
protected. The blocks can be marked as read-only or execute-only, providing different levels of code
protection. Read-only blocks cannot be erased or programmed, protecting the contents of those
blocks from being modified. Execute-only blocks cannot be erased or programmed, and can only
be read by the controller instruction fetch mechanism, protecting the contents of those blocks from
being read by either the controller or by a debugger.
Additional Features
JTAG TAP Controller (see page 150)
The Joint Test Action Group (JTAG) port is an IEEE standard that defines a Test Access Port and
Boundary Scan Architecture for digital integrated circuits and provides a standardized serial interface
for controlling the associated test logic. The TAP, Instruction Register (IR), and Data Registers (DR)
can be used to test the interconnections of assembled printed circuit boards and obtain manufacturing
information on the components. The JTAG Port also provides a means of accessing and controlling
design-for-test features such as I/O pin observation and control, scan testing, and debugging.
The JTAG port is composed of the standard five pins: TRST, TCK, TMS, TDI, and TDO. Data is
transmitted serially into the controller on TDI and out of the controller on TDO. The interpretation of
this data is dependent on the current state of the TAP controller. For detailed information on the
operation of the JTAG port and TAP controller, please refer to the IEEE Standard 1149.1-Test
Access Port and Boundary-Scan Architecture.
The Stellaris JTAG controller works with the ARM JTAG controller built into the Cortex-M3 core.
This is implemented by multiplexing the TDO outputs from both JTAG controllers. ARM JTAG
instructions select the ARM TDO output while Stellaris JTAG instructions select the Stellaris TDO
outputs. The multiplexer is controlled by the Stellaris JTAG controller, which has comprehensive
programming for the ARM, Stellaris, and unimplemented JTAG instructions.
System Control and Clocks (see page 163)
System control determines the overall operation of the device. It provides information about the
device, controls the clocking of the device and individual peripherals, and handles reset detection
and reporting.
Hardware Details
Details on the pins and package can be found in the following sections:
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June 18, 2012
Texas Instruments-Production Data