K4J55323QF-GC Datasheet, PDF (26/49 Pages) Samsung semiconductor – 256Mbit GDDR3 SDRAM

K4J55323QF-GC
Consecutive READ Bursts
256M GDDR3 SDRAM
T0
T1
T2
T8
T8n
T9
T9n T10 T10n
/CK
CK
COMMAND
READ
NOP
READ
NOP
NOP
NOP
ADDRESS
Bank a,
Col n
RDQS
CL = 8
Bank a,
Col b
DQ
DO
DO
n
b
DON’T CARE
TRANSITIONING DATA
NOTE : 1. DO n (or b) = data-out from column n (or column b).
2. Burst length = 4
3. Three subsequent elements of data-out appear in the programmed order following DQ n.
4. Three subsequent elements of data-out appear in the programmed order following DQ b.
5. Shown with nominal t_AC and t_DQSQ.
6. Example applies when READ commands are issued to different devices or nonconsecutive READs.
7. RDQS will start driving high one half-clock cycle prior to the first falling edge of RDQS.
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Rev 1.8 (Apr. 2005)