SLRC400 Datasheet, PDF (112/130 Pages) NXP Semiconductors – I·CODE Reader IC

Philips Semiconductors
I•CODE Reader IC
Product Specification Rev. 2.0 November 2001
SL RC400
18 TEST SIGNALS
18.1 General
The SL RC400 allows different kind of signal measurements. These measurements can be used to check the
internally generated and received signals using the possibilities of the serial signal switch as described in
chapter 15.
Furthermore, with the SL RC400 the user may select internal analog signals to measure them at pin AUX
and internal digital signals to observe them on pin SIGOUT by register selections. These measurements can
be helpful during the design-in phase to optimise the receiver’s behaviour or for test purpose.
18.2 Measurements Using the Serial Signal Switch
Using the serial signal switch at pin SIGOUT the user may observe data send to the label or data received
from the label. The following tables give an overview of the different signals available.
SignalToSIGOUT SIGOUTSelect
0
0
0
1
0
2
0
3
0
4
0
5
0
6
0
7
1
X
Signal routed to SIGOUT pin
LOW
HIGH
Envelope
Transmit NRZ
Manchester with Subcarrier
Manchester
RFU
RFU
Digital Test signal
Table 18-1 Signal routed to SIGOUT pin
112
Preliminary