X3100-01 Datasheet, PDF (34/41 Pages) Intersil Corporation – Cell Balancing Control

X3100, X3101
Description
Over-current mode detection
voltage
(Default in Boldface)
Sym
V_OC(4)
Condition
V_OC = 0.075V (VOC1, VOC0 = 0,0)
0^oC to 50^oC
V_OC = 0.100V (VOC1, VOC0 = 0,1)
0^oC to 50^oC
Min
0.050
0.060
0.075
0.085
Typ⁽²⁾
Max
0.100
0.090
0.125
0.115
V_OC = 0.125V (VOC1, VOC0 = 1,0) 0.100
0^oC to 50^oC 0.110
0.150
0.140
V_OC = 0.150V (VOC1, VOC0 = 1,1) 0.125
0^oC to 50^oC 0.135
0.175
0.165
Over-current mode detection time T_OC C_OC = 0.001µF
10
C_OC = 200pF
2
Over-current mode release time
T_OCR C_OC = 0.001µF
10
C_OC = 200pF
2
Load resistance over-current mode R_OCR Releases when OVP/LMON pin >
250
release condition
2.5V
Cell charge threshold voltage
X3101 wake-up voltage
(For Vcc above this voltage, the device
wakes up)
V_CE
V_SLR
V_CE = 0.5V (Vce1, Vce0 = 0,0)
V_CE = 0.8V (Vce1, Vce0 = 0,1)
V_CE = 1.1V (Vce1, Vce0 = 1,0)
V_CE = 1.4V (Vce1, Vce0 = 1,1)
See Wake-up test circuit
0.4
0.5
0.6
0.7
0.8
0.9
1
1.1
1.2
1.3
1.4
1.5
10.5
12.5
X3101 sleep voltage
(For Vcc above this voltage, the device
cannot go to sleep)
V_SLP See Sleep test circuit
9.5
11.5
Notes: (2) Typical at 25°C.
(3) See Figure 10 on page 22.
(4) The default setting is set at the time of shipping, but may be changed by the user via changes in the configuration register.
(5) For reference only, this parameter is not 100% tested.
Unit
V
V
V
V
ms
ms
kΩ
V
V
V
V
V
V
Wake-up test circuit (X3101)
Vcc
Sleep test circuit (X3101)
Vcc
Vcc RGP
VCELL1
RGC
VCELL2 _RGO
VCELL3
VCELL4
V_RGO
Vss
Increase Vcc until V_RGO turns on
Vcc RGP
VCELL1
RGC
1V
VCELL2 _RGO
V_RGO
1V
VCELL3
1V
VCELL4
Vss
Decrease Vcc until V_RGO turns off
34
FN8110.1
January 3, 2008