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TC1798 Datasheet, PDF (199/200 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller
TC1798
History
• update parameter description for SSC parameters t52, t53, t56, t57, t58, and t59
• change SSC parameters from CC to SR Symbol for t56, t57, t58 and t59
• add note to ERAY parameters for availability
• add parameters t15, t16, t17, t18, and t19 to the EBU
• adapt EBU parameters for DDR Timming
• add footnote to Flash parameter tERD
• change for parameter NE note from Max. data retention to Min.
• rework the 3.3 V current part of the Power Supply Parameters for better description
and usage
– Parameters IDDP_FP, IDDFL3E and IDDFL3R are removed and replaced in the following
way
– IDDP_FP is replaced by IDDP with the condition including flash programming current
– IDDFL3E is replaced by IDDP with the condition including flash erase verify current
– IDDFL3R is replaced by IDDP with the condition including flash read current
– parameter IDDFL3R was renamed to IDDFL3
The rework of the 3.3 V current part of the Power Supply Parameters was done for
simplification and clarification. Former given values could still be used if liked, the new
definition results in the same resulting values or slightly better values. The flash module
is supplied via IDDFL3 and IDDP. For the different flash operating modes in worst case
different allocations for the two domains resulting.
The application typical case ‘flash read’ has max IDDP of 25 mA and max IDDFL3 of 98 mA
resulting is a sum of 123 mA.
The case ‘flash programming’ has max IDDP of 55 mA and max IDDFL3 of 29 mA resulting
is a sum of 84 mA.
The case ‘flash erase verify’ has max IDDP of 40 mA and max IDDFL3 of 98 mA resulting
is a sum of 138 mA.
So for the old parameter IDDP with 35 mA, the new version reads as
IDDP = 25+IDDP_PORST = 32 mA for the same application relevant case.
The following changes where done between Version 1.0 and 1.1 of this document:
• change VILS from 2.1V to 1.9V in table 23
• change t48 from 100ns to 200ns in table 42
• change t49 from 100ns to 200ns in table 42
• extend KOVAN conditon from IOV≤ 0 mA; IOV≥ -1 mA to IOV≤ 0 mA; IOV≥ -2 mA
• change t8 from -4ns to -2ns in table 43
• change t18 from -4ns to -2ns in table 43
• change t37 parameter description from ‘Data output delay to WR rising edge,
deviation from the ideal programmed value’ to ‘Data output delay to WR falling edge,
deviation from the ideal programmed value’ in table 44
• Add RDSONx information for class B pads to table 18
• Add exact definition ‘edge= sharp ; pin out driver= strong’ for the pad conviguration
of the rise and fall times in table 18
Data Sheet
5
V 1.1, 2014-05