K10P81M100SF2 Datasheet, PDF (29/60 Pages) Freescale Semiconductor, Inc – K10 Sub-Family Data Sheet

Peripheral operating requirements and behaviors
Table 18. Flash command timing characteristics (continued)
Symbol Description
Min.
Typ.
Max.
Unit
Notes
t_rdrsrc Read Resource execution time
—
—
35
μs
1
t_pgm4 Program Longword execution time
—
50
TBD
μs
t_ersblk Erase Flash Block execution time
—
160
800
ms
2
t_ersscr Erase Flash Sector execution time
—
20
100
ms
2
t_pgmsec2k Program Section execution time (2 KB flash sec‐
—
TBD
TBD
ms
tor)
t_rd1all
t_rdonce
t_pgmonce
y _tersall
r _tvfykey
Read 1s All Blocks execution time
Read Once execution time
Program Once execution time
Erase All Blocks execution time
Verify Backdoor Access Key execution time
—
—
2.8
ms
—
—
35
μs
1
—
50
TBD
μs
—
320
1600
ms
2
—
—
35
μs
1
a ^{1. Assumes 25MHz flash clock frequency.}
2. Maximum times for erase parameters based on expectations at cycling end-of-life.
in ^{6.4.1.3 Flash (FTFL) Current and Power Parameters}
Table 19. Flash (FTFL) current and power parameters
Symbol
lim ^IDD_PGM
Description
Worst case programming current in program flash
Typ.
Unit
10
mA
e 6.4.1.4 Reliability Characteristics
Pr ^{Symbol Description}
Table 20. NVM reliability characteristics
Min.
Typ.¹
Max.
Unit
Notes
Program Flash
t_nvmretp10k Data retention after up to 10 K cycles
5
TBD
—
years
2
t_nvmretp1k Data retention after up to 1 K cycles
10
TBD
—
years
2
t_nvmretp100 Data retention after up to 100 cycles
15
TBD
—
years
2
n_nvmcycp Cycling endurance
10 K
TBD
—
cycles
3
1. Typical data retention values are based on intrinsic capability of the technology measured at high temperature derated to
25°C. For additional information on how Freescale defines typical data retention, please refer to Engineering Bulletin
EB618.
2. Data retention is based on T_javg = 55°C (temperature profile over the lifetime of the application).
3. Cycling endurance represents number of program/erase cycles at -40°C ≤ T_j ≤ 125°C
K10 Sub-Family Data Sheet Data Sheet, Rev. 1, 11/2010.
Freescale Semiconductor, Inc.
Preliminary
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