K10P81M100SF2 Datasheet, PDF (17/60 Pages) Freescale Semiconductor, Inc – K10 Sub-Family Data Sheet

General
inary
lim ^{Figure 2. Run mode supply current vs. core frequency — all peripheral clocks enabled}
e _{5.1.6 EMC radiated emissions operating behaviors}
r ^{Table 6. EMC radiated emissions operating behaviors}
P ^{Symbol Description}
Frequency
Typ.
Unit
band (MHz)
Notes
V_RE1
Radiated emissions voltage, band 1
0.15–50
TBD
dBμV
1, 2
V_RE2
Radiated emissions voltage, band 2
50–150
TBD
V_RE3
Radiated emissions voltage, band 3
150–500
TBD
V_RE4
Radiated emissions voltage, band 4
500–1000
TBD
V_{RE_IEC_SAE} IEC and SAE level
0.15–1000
TBD
—
2, 3
1. Determined according to IEC Standard 61967-1, Integrated Circuits - Measurement of Electromagnetic Emissions, 150
kHz to 1 GHz Part 1: General Conditions and Definitions, IEC Standard 61967-2, Integrated Circuits - Measurement of
Electromagnetic Emissions, 150 kHz to 1 GHz Part 2: Measurement of Radiated Emissions—TEM Cell and Wideband
TEM Cell Method, and SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated Circuits—TEM/
Wideband TEM (GTEM) Cell Method.
2. V_DD = 3 V, T_A = 25 °C, f_OSC = 16 MHz (crystal), f_BUS = 20 MHz
3. Specified according to Annex D of IEC Standard 61967-2, Measurement of Radiated Emissions—TEM Cell and Wideband
TEM Cell Method, and Appendix D of SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated
Circuits—TEM/Wideband TEM (GTEM) Cell Method.
K10 Sub-Family Data Sheet Data Sheet, Rev. 1, 11/2010.
Freescale Semiconductor, Inc.
Preliminary
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