S6E1C3 Datasheet, PDF (86/107 Pages) Cypress Semiconductor – 32-bit ARM® Cortex®-M0+ FM0+ Microcontroller

S6E1C3 Series
Definitions of 12-bit A/D Converter Terms
 Resolution:
Analog variation that is recognized by an A/D converter.
Integral Nonlinearity:
Deviation of the line between the zero-transition point (0b000000000000 ←→ 0b000000000001) and the
full-scale transition point (0b111111111110 ←→ 0b111111111111) from the actual conversion
characteristics.
Differential Nonlinearity: Deviation from the ideal value of the input voltage that is required to change the output code by 1 LSB.
Integral Nonlinearity
0xFFF
Actual conversion
0xFFE ^{characteristics}
{1 LSB(N-1) + VZT}
0xFFD
VFST
(Actually-
measured
0x004
value)
VNT
(Actually-measured
0x003
value)
Actual conversion
0x002
characteristics
Ideal characteristics
0x001
VZT (Actually-measured value)
Differential Nonlinearity
0x(N+1) ^{Actual conversion}
characteristics
Ideal characteristics
0xN
0x(N-1)
0x(N-2)
V(N+1)T
(Actually-measured
value)
VNT
(Actually-measured
value)
Actual conversion characteristics
VSS
AVRH
VSS
Analog input
Analog input
AVRH
Integral Nonlinearity of digital output N =
V_NT - {1LSB × (N - 1) + V_ZT}
1LSB
[LSB]
Differential Nonlinearity of digital output N =
V_{(N + 1) T} - V_NT
1LSB
- 1 [LSB]
1LSB =
V_FST – V_ZT
4094
N
: A/D converter digital output value.
V_ZT : Voltage at which the digital output changes from 0x000 to 0x001.
V_FST : Voltage at which the digital output changes from 0xFFE to 0xFFF.
V_NT : Voltage at which the digital output changes from 0x(N − 1) to 0xN.
Document Number: 002-00233 Rev.*B
Page 86 of 107