English
Language : 

M36DR432AD Datasheet, PDF (24/52 Pages) STMicroelectronics – 32 Mbit 2Mb x16, Dual Bank, Page Flash Memory and 4 Mbit 256Kb x16 SRAM, Multiple Memory Product
M36DR432AD, M36DR432BD
SRAM COMPONENT
The SRAM is a 4 Mbit (256Kb x16) low-power con-
sumption memory array with low VDDS data reten-
tion.
SRAM Operations
The following operations can be performed using
the appropriate bus cycles: Read Array, Write Ar-
ray, Output Disable, Power Down (see Table 2).
Read. Read operations are used to output the
contents of the SRAM Array. The SRAM is in Read
mode whenever Write Enable (WS) is at VIH with
Output Enable (GS) at VIL, Chip Enable ES and
UBS, LBS combinations are asserted.
Valid data will be available at the output pins within
tAVQV after the last stable address, provided that
GS is Low and ES is Low. If Chip Enable or Output
Enable access times are not met, data access will
be measured from the limiting parameter (tELQV or
tGLQV) rather than the address. Data out may be
indeterminate at tELQX and tGLQX, but data lines
will always be valid at tAVQV (see Table 23, Figures
17 and 18).
Write. Write operations are used to write data in
the SRAM. The SRAM is in Write mode whenever
the WS and ES pins are at VIL. Either the Chip En-
able input (ES) or the Write Enable input (WS)
must be de-asserted during address transitions for
subsequent write cycles. Write begins with the
concurrence of Chip Enable being active and WS
at VIL. A Write begins at the latest transition
among ES going to VIL and WS going to VIL.
Therefore, address setup time is referenced to
Write Enable and Chip Enable as tAVWL and tAVEL
respectively, and is determined by the latter occur-
ring edge. The Write cycle can be terminated by
the rising edge of ES or the rising edge of WS,
whichever occurs first.
If the Output is enabled (ES=VIL and GS=VIL),
then WS will return the outputs to high impedance
within tWLQZ of its falling edge. Care must be taken
to avoid bus contention in this type of operation.
Data input must be valid for tDVWH before the ris-
ing edge of Write Enable, or for tDVEH before the
rising edge of ES, whichever occurs first, and re-
main valid for tWHDX and tEHAX (see Table 24, Fig-
ure 20, 22, 24).
Standby/Power-Down. The SRAM chip has a
Chip Enable power-down feature which invokes
an automatic standby mode (see Table 23, Figure
19) whenever either Chip Enable is de-asserted
(ES=VIH).
Data Retention. The SRAM data retention per-
formances as VDDS go down to VDR are described
in Table 25 and Figure 24. In ES controlled data
retention mode, minimum standby current mode is
entered when ES ≥ VDDS – 0.2V.
Output Disable. The data outputs are high im-
pedance when the Output Enable (GS) is at VIH
with Write Enable (WS) at VIH.
24/52