English
Language : 

M36W0R6030T0 Datasheet, PDF (13/26 Pages) STMicroelectronics – 64 Mbit (4Mb x16, Multiple Bank, Burst) Flash Memory and 8 Mbit (512Kb x16) SRAM, Multi-Chip Package
M36W0R6030T0, M36W0R6030B0
DC AND AC PARAMETERS
This section summarizes the operating measure-
ment conditions, and the DC and AC characteris-
tics of the device. The parameters in the DC and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Conditions summarized in Table 4., Operating and
AC Measurement Conditions. Designers should
check that the operating conditions in their circuit
match the operating conditions when relying on
the quoted parameters.
Table 4. Operating and AC Measurement Conditions
Parameter
Flash Memory
Min
Max
SRAM
Unit
Min
Max
VDDF Supply Voltage
1.7
1.95
–
–
V
VDDS Supply Voltage
–
–
1.7
1.95
V
VDDQ Supply Voltage
1.7
1.95
–
–
V
VPPF Supply Voltage (Factory environment)
11.4
12.6
–
–
V
VPPF Supply Voltage (Application environment)
–0.4
VDDQ +0.4
–
–
V
Ambient Operating Temperature
–40
85
–40
85
°C
Load Capacitance (CL)
30
30
pF
Output Circuit Resistors (R1, R2)
16.7
16.7
kΩ
Input Rise and Fall Times
5
2
ns
Input Pulse Voltages
0 to VDDQ
0 to VDDS
V
Input and Output Timing Ref. Voltages
VDDQ/2
VDDS/2
V
Figure 6. AC Measurement I/O Waveform
VDDQ
0V
VDDQ/2
AI06161
Figure 7. AC Measurement Load Circuit
VDDQ
VDDF
VDDQ
0.1µF
0.1µF
DEVICE
UNDER
TEST
R1
CL
R2
Table 5. Device Capacitance
Symbol
Parameter
CIN
Input Capacitance
COUT
Output Capacitance
Note: Sampled only, not 100% tested.
CL includes JIG capacitance
AI08364B
Test Condition
VIN = 0V
VOUT = 0V
Min
Max
Unit
12
pF
15
pF
13/26