S1011 Datasheet, PDF (34/43 Pages) Seiko Instruments Inc – BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR

HIGH-WITHSTAND VOLTAGE BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR
S-1011 Series
Rev.1.2_00
 Reference Data
1. Detection delay time (t_RESET) vs. CN pin capacitance (C_N) (Without output pin capacitance)
1. 1 VDD detection product
S-1011A50
1000
100
Ta = 85C
Ta = 25C
10
1
Ta = 40C
0.1
0.01 0.1
1
10
CN [nF]
100 1000
2. Detection delay time (t_RESET) vs. Temperature (Ta)
2. 1 VDD detection product
S-1011A50
12.0
C_N = 3.3 nF
10.0
8.0
6.0
4.0
2.0
0.0
40 25
0
25 50
Ta [C]
75 85
VIH^*1
1 s
Input voltage
VIL^*2
VDD
tRESET
Output voltage
VDD  50%
VSS
*1. V_IH = −V_DET(S) + 1.0 V
*2. V_IL = −V_DET(S) − 1.0 V
Figure 45 Test Condition of Detection Delay Time
VDD
OUT
V_DD
+ VSS CP CN
V
C_N
R
100 kΩ
+
V
Figure 46 Test Circuit of Detection Delay Time
Caution The above connection diagram and constant will not guarantee successful operation.
Perform thorough evaluation using the actual application to set the constant.
34
Seiko Instruments Inc.