S1011 Datasheet, PDF (16/43 Pages) Seiko Instruments Inc – BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR

HIGH-WITHSTAND VOLTAGE BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR
S-1011 Series
Rev.1.2_00
V_DD
−V_DET max.
−V_DET min.
Detection voltage Release voltage
Detection voltage
range
+V_DET max.
+V_DET min.
V_DD
Release voltage
range
V_OUT
t_RESET
Figure 17 Detection Voltage (VDD detection product)
V_OUT
t_DELAY
Figure 18 Release Voltage (VDD detection product)
V_SENSE
Detection voltage Release voltage
−V_DET max.
−V_DET min.
Detection voltage
range
+V_DET max.
+V_DET min.
V_SENSE
Release voltage
range
V_OUT
t_RESET
Figure 19 Detection Voltage
(SENSE detection product)
V_OUT
t_DELAY
Figure 20 Release Voltage
(SENSE detection product)
VDD
R
100 kΩ
VDD
R
100 kΩ
V_DD
OUT
V_DD
SENSE
OUT
+
V
VSS CP CN
+
V
V_SENSE
+
V
VSS CP
CN
+
V
Figure 21 Test Circuit of Detection Voltage
and Release Voltage
(VDD detection product)
Figure 22 Test Circuit of Detection Voltage
and Release Voltage
(SENSE detection product)
3. Hysteresis width (V_HYS)
The hysteresis width is the voltage difference between the detection voltage and the release voltage (the voltage at
point B − the voltage at point A = V_HYS in Figure 24 and Figure 28). Setting the hysteresis width between the
detection voltage and the release voltage, prevents malfunction caused by noise on the input voltage.
4. Feed-through current
The feed-through current is a current that flows instantaneously to the VDD pin at the time of detection and release
of a voltage detector.
16
Seiko Instruments Inc.