SDA9206 Datasheet, PDF (51/54 Pages) Siemens Semiconductor Group – ADC with Built in Antialiasing filter and Clock generation UnitS

SDA 9206
L₃
+5 V
L₂
C ₁₁
+ ^{10 µF}
10 µH
+ _C13
10 µF
L₁
2.2 Hµ
R₄
8.2 Ω /
2%
1
TL 431
D1
2
+
C₇
1 µF
10 µH
C ₃₅
100 nF
C ₅₄
100 nF
C ₅₅
100 nF
C ₅₆
100 nF
C ₁₂
100 nF
3
R₃
62 Ω /
2%
R₂
100 nF
100 nF
100 nF
6.8 Ω /
2%
C₈
+
R₁
16 Ω /
2%
1 µF
C ₅₁
C ₅₂
C ₅₃
C ₄₈
C ₄₉
C ₅₀
C ₁₀
100 nF
100 nF
100 nF
100 nF
1
5
6
10
11
15
64
60
59
58
V _ADDY
V _AGNDY
V _ADDU
V _AGNDU
V _ADDV
V _AGNDV
V _ADDC
V _AGNDC
V _ADDPA
V _AGNDPA
V _DDQ
V _SSQ
V _DD
V _SS
V _DDQ
V _SSQ
V _DDDTO
V _SSDTO
V _DD
V _SS
PBQ0
2 _{V REFHY}
PBQ1
PBQ2
7 _{V REFHU}
12 _{V REFHV}
63 _{V REFHC}
PBQ3
PBQ4
PBQ5
PBQ6
PBQ7
PAQ0
ABACUS _PAQ1
SDA 9206 _PAQ2
4 _{V REFLY}
9 _{V REFLU}
14 _{V REFLV}
PAQ3
PAQ4
PAQ5
PAQ6
PAQ7
32
23
45
36
50
55
46
49
21
22
44
43
42
41
40
39
38
37
31
30
29
28
27
26
25
24
YIN
C₉
100 nF _{61 V REFLC}
C _{6 100 nF 3 AINY}
H2I2 ²⁰
EXSYN
HS
57
54
UIN
VIN
CVBS
C _{5 100 nF}
C _{4 100 nF}
C _{3 100 nF}
8 _AINU
13 _AINV
62 _SYNC
CLK1
H1I1
CLK2
53
17
52
BLN
VS
19
51
SCL
SDA
35
34
ADR0
SCL
33
16
SDA
RESIN
RESOUTN ¹⁸
TEST
X2
56
47
X1 ⁴⁸
C ₁₄
100 nF
C ₁₅
100 nF
UV0
UV1
UV2
UV3
UV4
UV5
UV6
UV7
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
CLK1
H1I1
CLK2
BLN
VS
RESOUTN
C ₂ 18 pF
C ₁ 18 pF
Q1
24.576 MHz
UES10472
Figure 20
Application Circuit 3
Semiconductor Group
51
1999-02-10