R01DS0190EJ0100 Datasheet, PDF (89/110 Pages) Renesas Technology Corp – 32 MHz 32-bit RX MCUs, 50 DMIPS, up to 128 Kbytes of flash memory

RX111 Group
5. Electrical Characteristics
Table 5.37 A/D Conversion Characteristics (2)
Conditions: VCC = AVCC0 = VREFH0 = 2.4 to 2.7 V, VSS = AVSS0 = VREFL0 = VSS_USB = 0 V, PCLKD = 4 to 16 MHz,
T_a = –40 to +105°C
Item
Min.
Typ.
Max.
Unit
Test Conditions
Resolution
—
—
12
Bit
Conversion time*¹ Permissible signal source
2.062
—
—
µs
High-precision channel
(Operation at
impedance (Max.) = 1.0 kΩ
(0.625)*²
ADCSR.ADHSC bit = 1
fPCLKD = 16 MHz)
ADSSTRn.SST[7:0] bits = 09h
2.750
—
—
µs
Normal-precision channel
(1.313)*²
ADCSR.ADHSC bit = 1
ADSSTRn.SST[7:0] bits = 14h
Offset error
—
±0.5
±6.0
LSB
Full-scale error
—
±1.25
±6.0
LSB
Quantization error
—
±0.5
—
LSB
Absolute accuracy
—
±3.0
±8.0
LSB
DNL differential nonlinearity error
—
±1.0
—
LSB
INL integral nonlinearity error
—
±1.5
±3.0
LSB
Note: • The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential nonlinearity error, and INL integral nonlinearity error do not
include quantization errors.
Note 1. The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
Note 2. The value in parentheses indicates the sampling time.
Table 5.38 A/D Conversion Characteristics (3)
Conditions: VCC = AVCC0 = VREFH0 = 1.8 to 2.4 V, VSS = AVSS0 = VREFL0 = VSS_USB = 0 V, PCLKD = 1 to 8 MHz,
T_a = –40 to +105°C
Item
Min.
Typ.
Max.
Unit
Test Conditions
Resolution
—
—
12
Bit
Conversion time*¹ Permissible signal source
4.875
—
—
µs
High-precision channel
(Operation at
impedance (Max.) = 5.0 kΩ
(1.250)*²
ADCSR.ADHSC bit = 0
PCLKD = 8 MHz)
ADSSTRn.SST[7:0] bits = 09h
6.250
—
—
(2.625)*²
Normal-precision channel
ADCSR.ADHSC bit = 0
ADSSTRn.SST[7:0] bits = 14h
Offset error
—
±0.5
±24.0
LSB
Full-scale error
—
±1.25
±24.0
LSB
Quantization error
—
±0.5
—
LSB
Absolute accuracy
—
±2.75
±32.0
LSB
DNL differential nonlinearity error
—
±1.0
—
LSB
INL integral nonlinearity error
—
±1.25
±12.0
LSB
Note: • The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential nonlinearity error, and INL integral nonlinearity error do not
include quantization errors.
Note 1. The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
Note 2. The value in parentheses indicates the sampling time.
R01DS0190EJ0100 Rev.1.00
Jun 19, 2013
Page 89 of 107