TLE6266G Datasheet, PDF (36/50 Pages) Infineon Technologies AG – System Basis Chip

Target Datasheet TLE 6266
8.3 Electrical Characteristics (cont’d)
9 V < V_S < 16 V; I_CC = -100 mA; normal mode; all outputs open; – 40 °C < T_j < 150 °C; CAN-
transceiver circuitry: – 40 °C < T_j < 125 °C; all voltages with respect to ground; positive current
defined flowing into pin; unless otherwise specified.
Parameter
Symbol Limit Values Unit Test Condition
min. typ. max.
Minimum dominant time for t_wu(min) 8
wake-up on CANL or CANH
22
38
µs ^{stand-by mode;}
V_S = 12 V
Minimum wake-up time on t_WK(min) 15
pin WK (wake-up)
25
50
µs ^{Low power mode; V}S ⁼
12 V
Failure cases 3 and 6
detection time
t_fail
10
45
80
µs ^{normal operating}
mode
Failure case 6a detection
time
2
4
8
ms ^{normal operating}
mode
Failure cases 5, 6, 6a and 7
recovery time
10
45
80
µs ^{normal operating}
mode
Failure cases 3
recovery time
250 500 750 µs
normal operating
mode
Failure cases 5 and 7
detection time
1.0 2.0 4.0 ms ^{normal operating}
mode
Failure cases 5 detection
time
0.4 1.0 2.4 ms ^{stand-by mode;}
V_S = 12 V
Failure cases 6, 6a and 7
detection time
0.8 4.0 8.0 ms ^{stand-by mode;}
V_S = 12 V
Failure cases 5, 6, 6a and 7
recovery time
–
2
–
µs ^{stand-by mode;}
V_S = 12 V
Propagation delay
t_PD(L)
TxD-to-RxD LOW (recessive
–
1.5 2.1 µs ^C1 ^{= 100 pF;}
C₂ = 0; R₁ = 100 W; no
failures and bus failure
to dominant)
cases 1, 2, 3a and 4
–
1.7 2.4 µs ^C1 ^{= C}2 ^{= 3.3 nF;}
R₁ = 100 W; no bus
failure and failure
cases 1, 2, 3a and 4
–
1.8 2.5 µs ^C1 ^{100 pF; C}2 ^{= 0;}
R₁ = 100 W; bus failure
cases 3, 5, 6, 6a and 7
–
2.0 2.6 µs ^C1 ^{= C}2 ^{= 3.3 nF;}
R₁ =100 W; bus failure
cases 3, 5, 6, 6a and 7
Version 1.06
37
2002-11-26