TC1797_14 Datasheet, PDF (136/192 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller

TC1797
Electrical Parameters
4) See additional document “TC1767 Pin Reliability in Overload“ for definition of overload current on digital pins.
5) The overload coupling factor (kA) defines the worst case relation of an overload condition (IOV) at one pin to
the resulting leakage current (IleakTOT) into an adjacent pin: IleakTOT = ±kA × |IOV| + IOZ1.
Thus under overload conditions an additional error leakage voltage (VAEL) will be induced onto an adjacent
analog input pin due to the resistance of the analog input source (RAIN). That means VAEL = RAIN ×
|IleakTOT|.
The definition of adjacent pins is related to their order on the silicon.
The Injected leakage current always flows in the opposite direction from the causing overload current.
Therefore, the total leakage current must be calculated as an algebraic sum of the both component leakage
currents (the own leakage current IOZ1 and the optional injected leakage current).
6) The PLL jitter characteristics add to this value according to the application settings. See the PLL jitter
parameters.
7) Applicable for digital outputs.
Table 9
Group
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Pin Groups for Overload / Short-Circuit Current Sum Parameter
Pins
P4.[7:0]
P4.[15:8]
P10.[5:0]
P15.[0, 1, 7:4, 11, 12]
P15.[3:0, 8, 13], P16.3
P15.9, P16.2, P15.10, P15.[15:14]
P14.[15:10]
P14.[9:8]
P14.[7:2]
P14.[1:0], P13.[15:14]
P13.[13:12]
P13.[11:6]
P13.[5:2]
P13.[1:0], P12[5:4]
P12.[3:0]
P11.[15:12]
P11.[11:8]
P11.[7:4]
P11.[3:0]
P12.[7:6]
Data Sheet
132
V1.3, 2014-08