908E621_07 Datasheet, PDF (18/62 Pages) Freescale Semiconductor, Inc – Integrated Quad Half-Bridge and Triple High-Side with Embedded MCU and LIN for High End Mirror

TIMING DIAGRAMS
TIMING DIAGRAMS
LIN, L0
10k
1nF
Transient Pulse
Generator
Note: Waveform in accordance to ISO7637 part 1, test pulses 1, 2, 3a and 3b.
Figure 4. Test Circuit for Transient Test Pulses
V^VS^SU^UP^P
908E621
18
TXD
RXD
R0
LIN
R• _10.R-0a10n_kkad_ΩOnC_dha0mnCdC0ao1_ncdm._o0m1bn_nbinF_Fina_ati_to_ion_ns_s:_:
• 60_- 0₆₆Ω_{0 O}an_hd_m6_a._n8_dn₆F_.8nF
C0
• 50_- 0₅₀Ω_{0 O}an_hd_m1_a0_ndnF_10nF
Figure 5. Test Circuit for LIN Timing Measurements
TXD
VLIN
LIN
RXD
tDOM-MIN
58.1% VSUP
40% VSUP
tDOM-MAX
28.4% VSUP
tREC-MAX
74.4% VSUP
60% VSUP
42.2% VSUP
tREC-MIN
tRL
tRH
Figure 6. LIN Timing Measurements for Normal Slew Rate
Analog Integrated Circuit Device Data
Freescale Semiconductor