ES29LV160F Datasheet, PDF(39/71 Page) Excel Semiconductor Inc. – 16 Megabit (2 M x 8-Bit/1 M x 16-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory

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ES29LV160F Datasheet, PDF (39/71 Pages) Excel Semiconductor Inc. – 16 Megabit (2 M x 8-Bit/1 M x 16-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory

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ES29LV160F

Excel Semiconductor Inc.

Notes

1. DQ5 switches to 1 when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits.

See DQ5: Exceeded Timing Limits on page 38 for more information.

2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details.

12. Absolute Maximum Ratings

Storage Temperature Plastic

Packages

Ambient Temperature with Power

Applied

Voltage with Respect to Ground

VCC (Note 1)

A9, OE#, and RESET# (Note 2)

All other pins (Note 1)

Output Short Circuit Current (Note 3)

-65â to + 150â

-65â to + 125â

-0.5 V to +4.0 V

-0.5 V to +12.5 V

-0.5 V to VCC +0.5 V

200 mA

Notes

1. Minimum DC voltage on input or I/O pins is â0.5 V. During voltage transitions, input or I/O pins may overshoot VSS to â2.0 V

for periods of up to 20 ns. See Figure 13.1 on page 40. Maximum DC voltage on input or I/O pins is VCC +0.5 V. During voltage

transitions, input or I/ O pins may overshoot to VCC +2.0 V for periods up to 20 ns. See Figure 13.2 on page 40.

2. Minimum DC input voltage on pins A9, OE#, and RESET# is -0.5 V. During voltage transitions, A9, OE#, and RESET# may

overshoot VSS to â2.0 V for periods of up to 20 ns. See Figure 13.1 on page 40. Maximum DC input voltage on pin A9 is +12.5

V which may overshoot to 14.0 V for periods up to 20 ns.

3. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than one

second.

4. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections

of this data sheet is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect

device reliability.

Rev.0A (Dec 12, 2007) 39

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