CC2510FX Datasheet, PDF (18/253 Pages) List of Unclassifed Manufacturers – True System-on-Chip with Low Power RF Transceiver and 8051 MCU

CC2510Fx / CC2511Fx
7.10 8-14 bit ADC
T_A=25°C, VDD=3.0V if nothing else stated. The numbers given here are based on tests
performed in accordance to the IEEE Std 1241-2000 [4].
Parameter
Min Typ Max Unit Condition/Note
Input voltage
External reference voltage
External reference voltage
differential
Number of bits (ENOB)
Offset
Conversion time
Differential nonlinearity
(DNL)³
Integral nonlinearity (INL)³
SINAD^{2 3}
(sine input)
0
AVDD V
AVDD is voltage on AVDD pin
0
AVDD V
AVDD is voltage on AVDD pin
0
AVDD V
AVDD is voltage on AVDD pin
7
13 bits
The ADC is a delta-sigma. Effective resolution
depends on sample rate used.
Differential input signal and reference assumed.
-
-
-
Offset should be measured by sampling internal
AGND¹.
18
122
CC2510 using 26 MHz system clock.
µs
20
132
CC2511Fx using 24 MHz system clock.
±0.3
LSB 8-bits setting
±0.8
LSB 8-bits setting
45
dB
8-bits setting
56
dB
10-bits setting
66
dB
12-bits setting
75
dB
14-bits setting
Table 16: 8-14 bit ADC Characteristics
1 _{The offset value depends on several factors as: mode of operation, temperature, voltage, noise,}
reference etc. In order to sample with high accuracy, the DC value of internal AGND and AVDD
should be measured before starting the wanted sampling sequence. Thus, knowing the statistical
nonlinearity and effective number of bits, the correct sample value can easily be calculated.
2 _{The calculation assumes a differential input signal and a correlated differential reference.}
3 _{DNL, INL and SINAD are measured using dynamic characterisation methods by applying a sine}
wave input at P0.0 with AVDD_SOC as reference.
CC2510Fx/CC2511Fx PRELIMINARY Data Sheet (Rev. 1.2) SWRS055A Page 18 of 252