LM3S601 Datasheet, PDF (50/446 Pages) List of Unclassifed Manufacturers – Microcontroller

JTAG Interface
5.4
5.4.1
Register Descriptions
There are no APB-accessible registers in the JTAG TAP Controller or Shift Register chains. The
registers within the JTAG controller are all accessed serially through the TAP Controller. The registers
can be broken down into two main categories: Instruction Registers and Data Registers.
Instruction Register (IR)
The JTAG TAP Instruction Register (IR) is a four-bit serial scan chain with a parallel load register
connected between the JTAG TDI and TDO pins. When the TAP Controller is placed in the correct
states, bits can be shifted into the Instruction Register. Once these bits have been shifted into the
chain and updated, they are interpreted as the current instruction. The decode of the Instruction
Register bits is shown in Table 5-2 on page 50. A detailed explanation of each instruction, along
with its associated Data Register, follows.
Table 5-2. JTAG Instruction Register Commands
IR[3:0]
Instruction
Description
0000
EXTEST
Drives the values preloaded into the Boundary Scan Chain by the SAMPLE/PRELOAD
instruction onto the pads.
0001
INTEST
Drives the values preloaded into the Boundary Scan Chain by the SAMPLE/PRELOAD
instruction into the controller.
0010 SAMPLE / PRELOAD Captures the current I/O values and shifts the sampled values out of the Boundary Scan
Chain while new preload data is shifted in.
1000
ABORT
Shifts data into the ARM Debug Port Abort Register.
1010
DPACC
Shifts data into and out of the ARM DP Access Register.
1011
APACC
Shifts data into and out of the ARM AC Access Register.
1110
IDCODE
Loads manufacturing information defined by the IEEE Standard 1149.1 into the IDCODE
chain and shifts it out.
1111
BYPASS
Connects TDI to TDO through a single Shift Register chain.
All Others
Reserved
Defaults to the BYPASS instruction to ensure that TDI is always connected to TDO.
5.4.1.1
5.4.1.2
EXTEST Instruction
The EXTEST instruction does not have an associated Data Register chain. The EXTEST instruction
uses the data that has been preloaded into the Boundary Scan Data Register using the
SAMPLE/PRELOAD instruction. When the EXTEST instruction is present in the Instruction Register,
the preloaded data in the Boundary Scan Data Register associated with the outputs and output
enables are used to drive the GPIO pads rather than the signals coming from the core. This allows
tests to be developed that drive known values out of the controller, which can be used to verify
connectivity.
INTEST Instruction
The INTEST instruction does not have an associated Data Register chain. The INTEST instruction
uses the data that has been preloaded into the Boundary Scan Data Register using the
SAMPLE/PRELOAD instruction. When the INTEST instruction is present in the Instruction Register,
the preloaded data in the Boundary Scan Data Register associated with the inputs are used to drive
the signals going into the core rather than the signals coming from the GPIO pads. This allows tests
to be developed that drive known values into the controller, which can be used for testing. It is
important to note that although the RST input pin is on the Boundary Scan Data Register chain, it
is only observable.
50
October 01, 2007
Preliminary