EPF8452ATC100-4N Datasheet, PDF (27/62 Pages) Altera Corporation – Programmable Logic Device Family

FLEX 8000 Programmable Logic Device Family Data Sheet
Figure 15. FLEX 8000 AC Test Conditions
Power supply transients can affect AC
measurements. Simultaneous transitions
of multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast-ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients flow
through the parasitic inductance between
the device ground pin and the test system
ground, significant reductions in
observable noise immunity can result.
Numbers in parentheses are for 3.3-V
devices or outputs. Numbers without
parentheses are for 5.0-V devices or
outputs.
464 Ω
(703 Ω)
Device
Output
250 Ω
(8.06 KΩ)
Device input
rise and fall
times < 3 ns
VCC
To Test
System
C1 (includes
JIG capacitance)
Operating
Conditions
Tables 9 through 12 provide information on absolute maximum ratings,
recommended operating conditions, operating conditions, and
3
capacitance for 5.0-V FLEX 8000 devices.
Table 9. FLEX 8000 5.0-V Device Absolute Maximum Ratings Note (1)
Symbol
Parameter
V _CC
V_I
I _OUT
T _STG
T _AMB
T_J
Supply voltage
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
Conditions
With respect to ground (2)
No bias
Under bias
Ceramic packages, under bias
PQFP and RQFP, under bias
Min
–2.0
–2.0
–25
–65
–65
Max Unit
7.0
V
7.0
V
25
mA
150
°C
135
°C
150
°C
135
°C
Altera Corporation
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