GC5316 Datasheet, PDF (69/75 Pages) Texas Instruments – HIGH-DENSITY DIGITAL DOWNCONVERTER AND UPCONVERTER

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GC5316
SLWS154A − JANUARY 2004 − REVISED MARCH 2004
6.5 Factory Test and No Connect Signals
SIGNAL NAME
BALL DESIG
testmode0
R26
testmode1
P24
scanen
P25
aflag_tst
E24
sync_tst
D25
clk_tst
C26
fa002_scan
T26
fa002_clk
R23
fa002_out
T25
zero
N25
F26, G24, G25, H23, L23
K25, M23, L25, N24, R25,
D26, E25, E26, F24, F25, G23, J26
6.6 Power and Ground Signals
TYPE
input
input
input
output
output
output
input
input
output
input
input
no connect
NOTE
Do not connect
Do not connect
Do not connect
Do not connect
Do not connect
Do not connect
Do not connect
Do not connect
Do not connect
Do not connect
Tie each pin high through 100-Ω resistors to VPAD
Do not connect
SIGNAL NAME
BALL DESIG
GND
A1, A2, A13, A14, A25, A26, B1, B3, B24, B26, C2, C25, N1, N26, P1, P26, AD2, AD25, AE1, AE24,
AE3, AE26, AF1, AF2, AF13, AF14, AF25, AF26, L11, L12, L13, L14, L15, L16, M11−M16, N11−N16,
P11−P16, R11−R16, T11−T16
VCORE
B2, D4, N4, AC4, AE2, B25, D23, P23, AC23, AE25, C3, J4, V4, AD3, C24, J23, V23, AD24
VPAD
D6, D12, D18, AC6, AC12, AC18, D9, D15, D21, AC9, AC15, AC21
6.7 Power Monitoring
DESCRIPTION
Ground
Core power
I/O power
SIGNAL NAME
vcoremon
gndmon
BALL DESIG
N24
R25
DESCRIPTION
These pins monitor the internal power distribution. They cannot carry significant current and should not
be connected to normal power and ground. It is recommended that this pin be brought to a small probe
point for future monitoring/debugging purposes.
It is recommended that this pin be brought to a probe point for future monitoring/debugging purposes.
6.8 JTAG
The JTAG standard for boundary scan testing is implemented for board testing purposes. Internal scan test is not
be supported. Five device pins are dedicated for JTAG support: tdi, tdo, tms, tck, and trst_n. The BSDL file is available
on the web.
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