GC4114 Datasheet, PDF (36/45 Pages) Texas Instruments – QUAD TRANSMIT CHIP

GC4114 QUAD TRANSMIT CHIP
DATA SHEET REV 1.0
7.6 DIAGNOSTICS
Four diagnostic tests are described here. These tests use the diagnostic ramp as the input data source and
the counter for synchronization. The tests are run by loading the configurations, waiting for the checksum to stabilize
(about 4 million clock cycles), and then reading the checksum from address 15 and comparing it to the expected
checksum shown in each configuration table for address 15:
Table 12: Diagnostic Test 1 Configuration
Control Registers
Channel, Status and Coefficient Pages
Address
Data
Address
Page 0
00 (HEX)
2A (HEX)
20 (HEX)
55
01
90
21
AA
02
07
22
55
03
07
23
AA
04
00
24
55
05
00
25
AA
06
FF
26
55
07
0F
27
00
08
AA
28
AA
09
AA
29
55
0A
AA
2A
AA
0B
AA
1B
55
0C
AA
2C
AA
0D
0A
2D
55
0E
08
2E
AA
0F
15¹
2F
00
10
00
30
55
11
00
31
AA
12
00
32
55
13
00
33
AA
14
00
34
55
15
00
35
AA
16
00
36
55
17
00
37
00
18
00
38
AA
19
00
39
55
1A
00
3A
AA
1B
00
3B
55
1C
00
3C
AA
1D
00
3D
55
1E
00
3E
AA
1F
00
3F
00
1. This is the read-only expected checksum.
Page 1
00
read only
Page 2
unused
Page 3
Texas Instruments Inc.
- 32 -
MAY 22, 2000
This document contains information which may be changed at any time without notice