RX220_15 Datasheet, PDF (86/107 Pages) Renesas Technology Corp – Renesas MCUs

RX220 Group
5. Electrical Characteristics
Table 5.34 A/D Conversion Characteristics (2)
Conditions: VCC = AVCC0 = 1.62 to 3.6 V, 1.62 ≤ VREFH0 ≤ 2.7 V, AVCC0 – 0.9 V ≤ VREFH0 ≤ AVCC0,
VSS = AVSS0 = VREFL0 = 0 V, T_a = –40 to +105°C
Item
Min.
Typ.
Max.
Unit
Test Conditions
A/D conversion clock frequency (fPCLKD)
1
—
8
MHz
Resolution
—
—
12
Bit
Conversion time*¹ Permissible signal source
5.25
—
—
µs
Sampling in 12 states
(Operation at
impedance (Max.) = 1 kΩ
(1.5)*²
fPCLKD = 8 MHz) _{Permissible signal source}
6.25
—
—
Sampling in 20 states
impedance (Max.) = 5 kΩ
(2.5)*²
Analog input capacitance
—
—
30
pF
Offset error
—
±0.5
±7.5
LSB
Full-scale error
—
±1.25
±7.5
LSB
Quantization error
—
±0.5
—
LSB
Absolute accuracy
—
±3.0
±8.0
LSB
DNL differential nonlinearity error
—
±1.25
—
LSB
INL integral nonlinearity error
—
±1.5
±5.0
LSB
Note: • The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential nonlinearity error, and INL integral nonlinearity error do not
include quantization errors.
Note 1. The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
Note 2. The value in parentheses indicates the sampling time.
Table 5.35 Sampling Time
Conditions: VCC = AVCC0 = 1.62 to 5.5 V, VSS = AVSS0 = VREFL0 = 0 V, T_a = –40 to +105°C
Sampling time
Item
High-precision channel
Symbol
Ts
Typ.
0.208 + 0.417 × R0 (kΩ)
Normal-precision channel
Unit Test Conditions
µs
Figure 5.49
RX220
R0
ANi
Figure 5.49 Internal Equivalent Circuit of Analog Input Pin
R01DS0130EJ0110 Rev.1.10
Dec 20, 2013
Page 86 of 105