CLRC632 Datasheet, PDF (67/163 Pages) NXP Semiconductors – Multiple Protocol Contactless Reader IC

Philips Semiconductors
Multiple Protocol Contactless Reader IC
5.2.8.6 TestDigiSelect Register
Selects digital test mode.
Name: TestDigiSelect
Address:0x3D
Product Specification Rev. 3.0; May 2003
CL RC632
Reset value: xxxxxxxx, 0xxx
7
6
5
4
3
2
1
0
SignalTo
MFOUT
TestDigiSignalSel
Access
w
w
w
w
w
w
w
w
Rights
Description of the bits
Bit
Symbol
Function
7 SignalToMFOUT Set to 1, overrules the setting in MFOUTSelect and the digital test signal defined
in TestDigiSignalSel is routed to pin MFOUT instead.
Set to 0, MFOUTSelect defines the signal delivered at pin MFOUT.
6-0 TestDigiSignalSel Selects the digital test signal to be routed to pin MFOUT.
For detailed information refer to chapter 21.4
TestDigiSignalSel Signal Name
F4_hex
E4_hex
D4_hex
C4_hex
B5_hex
A5_hex
96_hex
83_hex
E2_hex
s_data
s_valid
s_coll
s_clock
rd_sync
wr_sync
int_clock
BPSK_out
BPSK_sig
5.2.8.7 RFU Registers
Name: RFU
7
6
x
x
Access
w
w
Rights
Address: 0x3E, 0x3F
5
4
x
x
w
w
Note: These registers are reserved for future use.
Reset value: xxxxxxxx, 0xxx
3
2
1
0
x
x
x
x
w
w
w
w
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