CLRC632 Datasheet, PDF (146/163 Pages) NXP Semiconductors – Multiple Protocol Contactless Reader IC

Philips Semiconductors
Multiple Protocol Contactless Reader IC
Product Specification Rev. 3.0; May 2003
CL RC632
21.4 Digital Test-Signals
Digital test signals may be routed to pin MFOUT by setting bit SignalToMFOUT to 1. A digital test signal may
be selected via the register bits TestDigiSignalSel in Register TestDigiSelect.
The signals selected by a certain TestDigiSignalSel setting is shown in the table below:
TestDigiSignalSel
F4_hex
E4_hex
D4_hex
C4_hex
B5_hex
A5_hex
96_hex
83_hex
E2_hex
00_hex
Signal Name
s_data
s_valid
s_coll
s_clock
rd_sync
wr_sync
int_clock
BPSK_out
BPSK_sig
no test signal
Description
Data received from the card.
Shows with 1, that the signals s_data and s_coll are valid.
Shows with 1, that a collision has been detected in the current bit.
Internal serial clock: during transmission, this is the coder-clock and during
reception this is the receiver clock.
Internal synchronised read signal (derived from the parallel µ-Processor
interface).
Internal synchronised write signal (derived from the parallel µ-Processor
interface).
Internal 13.56 MHz clock.
BPSK signal output
BPSK signal’s amplitude detected
output as defined by MFOUTSelect are routed to pin MFOUT.
Table 21-3: Digital Test Signal Selection
If no test signals are used, the value for the TestDigiSelect-Register shall be 00_hex.
Note: All other values of TestDigiSignalSel are for production test purposes only.
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