CLRC632 Datasheet, PDF (148/163 Pages) NXP Semiconductors – Multiple Protocol Contactless Reader IC

Philips Semiconductors
Multiple Protocol Contactless Reader IC
Product Specification Rev. 3.0; May 2003
CL RC632
21.6 Examples of I•CODE1 Analog- and Digital Test Signals
Fig. 17 shows the answer of an I•CODE1 Label IC to a unselected read command using the Qclock
receiving path.
RX –Reference is given to show the Manchester modulated signal at the RX pin. This signal is demodulated
and amplified in the receiver circuitry VRXAmpQ shows the amplified side band signal having used the Q-
Clock for demodulation. The signals VCorrDQ and VCorrNQ generated in the correlation circuitry are
evaluated and digitised in the evaluation and digitizer circuitry. VEvalR and VEvalL show the evaluation
signal of the right and left half bit. Finally, the digital test-signal S_data shows the received data which is
send to the internal digital circuit and S_valid indicates that the received data stream is valid.
Receiving path Q-Clock
VrxAmpQ
VcorrDQ
VcorrNQ
VevalR
VevalL
Sdata
SValid
50µsec/Dev.
500µsec/Dev.
Figure 24. Receiving path Q-Clock
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