CLRC632 Datasheet, PDF (142/163 Pages) NXP Semiconductors – Multiple Protocol Contactless Reader IC

Philips Semiconductors
Multiple Protocol Contactless Reader IC
Product Specification Rev. 3.0; May 2003
CL RC632
21 TEST SIGNALS
21.1 General
The CL RC632 allows different kind of signal measurements. These measurements can be used to check
the internally generated and received signals using the possibilities of the serial signal switch as described in
chapter 15.
Furthermore, with the CL RC632 the user may select internal analogue signals to measure them at pin AUX
and internal digital signals to observe them on pin MFOUT by register selections. These measurements can
be helpful during the design-in phase to optimise the receiver’s behaviour or for test purpose.
21.2 Measurements Using the Serial Signal Switch
Using the serial signal switch at pin MFOUT the user may observe data send to the card or data received
from the card. The following tables give an overview of the different signals available.
SignalToMFOUT
0
0
0
0
0
0
0
0
1
MFOUTSelect
0
1
2
3
4
5
6
7
X
Signal routed to MFOUT pin
LOW
HIGH
Envelope
Transmit NRZ
Manchester with Subcarrier
Manchester
RFU
RFU
Digital Test signal
Table 21-1 Signal routed to MFOUT pin
Note: The routing of the Manchester and the Manchester with Subcarrier signal to the MFOUT is only
possible at 106 kbaud according to ISO14443A.
142
Confidential