CLRC632 Datasheet, PDF (145/163 Pages) NXP Semiconductors – Multiple Protocol Contactless Reader IC

Philips Semiconductors
Multiple Protocol Contactless Reader IC
Product Specification Rev. 3.0; May 2003
CL RC632
21.3 Analog Test-Signals
The analog test signals may be routed to pin AUX by selecting them with the register bits TestAnaOutSel.
Value
0
1
2
3
4
5
6
7
8
9
A
B
C
D
E
F
Signal Name
V_mid
V_bandgap
V_RxFollI
V_RxFollQ
V_RxAmpI
V_RxAmpQ
V_CorrNI
V_CorrNQ
V_CorrDI
V_CorrDQ
V_EvalL
V_EvalR
V_Temp
rfu
rfu
rfu
Description
Voltage at internal node Vmid
Internal reference voltage generated by the band gap.
Output signal from the demodulator using the I-clock.
Output signal from the demodulator using the Q-clock.
I-channel subcarrier signal amplified and filtered.
Q-channel subcarrier signal amplified and filtered.
Output signal of N-channel correlator fed by the I-channel subcarrier
signal.
Output signal of N-channel correlator fed by the Q-channel subcarrier
signal.
Output signal of D-channel correlator fed by the I-channel subcarrier
signal.
Output signal of D-channel correlator fed by the Q-channel subcarrier
signal.
Evaluation signal from the left half bit.
Evaluation signal from the right half bit.
Temperature voltage derived from band gap.
Reserved for future use
Reserved for future use
Reserved for future use
Table 21-2: Analog Test Signal Selection
145
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