English
Language : 

SAA7385 Datasheet, PDF (47/64 Pages) NXP Semiconductors – Error correction and host interface IC for CD-ROM SEQUOIA
Philips Semiconductors
Error correction and host interface IC for
CD-ROM (SEQUOIA)
Preliminary specification
SAA7385
14 LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL
PARAMETER
VDD
Vi(max)
Vo
Tstg
digital supply voltage
maximum input voltage on any pin
output voltage on any output
storage temperature
MIN.
−0.5
VSS − 0.5
−0.5
−55
MAX.
+7
VDD + 0.5
+7
+150
UNIT
V
V
V
°C
15 OPERATING CHARACTERISTICS
15.1 I2S-bus timing; data mode
VDD = 4.75 to 5.25 V; VSS = 0 V; Tamb = −10 to +70 °C; unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
I2S-bus timing (single speed × n); see Fig.13 and note 1
CLOCK INPUT: CLAB
Tcy
output clock period sample rate = fs −
472.4/n
−
ns
sample rate = 2 fs −
236.2/n
−
ns
sample rate = 4 fs −
118.1/n
−
ns
tCH
clock HIGH time
sample rate = fs 166/n
−
−
ns
sample rate = 2fs 83/n
−
−
ns
sample rate = 4fs 42/n
−
−
ns
tCL
clock LOW time
sample rate = fs 166/n
−
−
ns
sample rate = 2fs 83/n
−
−
ns
sample rate = 4fs 42/n
−
−
ns
INPUTS: DAAB, WSAB AND EFAB
tsu
set-up time
sample rate = fs 95/n
−
−
ns
sample rate = 2fs 48/n
−
−
ns
sample rate = 4fs 24/n
−
−
ns
th
hold time
sample rate = fs 95/n
−
−
ns
sample rate = 2fs 48/n
−
−
ns
sample rate = 4fs 24/n
−
−
ns
Note
1. The I2S-bus timing is directly related to the overspeed factor ‘n’ in the normal operating mode. In the lock-to-disc
mode ‘n’ is replaced by the disc speed factor ‘d’.
1996 Jun 19
47