MT40A256M16GE-075EAUT Datasheet, PDF (311/359 Pages) Micron Technology – Automotive DDR4 SDRAM

4Gb: x8, x16 Automotive DDR4 SDRAM
Current Specifications – Patterns and Test Conditions
Current Specifications – Patterns and Test Conditions
Current Test Definitions and Patterns
Table 137: I_DD0 and I_PP0 Measurement-Loop Pattern¹
Data³
0
0
ACT 0 0 0 0 0 0 0 0 0 0 0 0 0 0
–
1, 2
D, D 1 0 0 0 0 0 0 0 0 0 0 0 0 0
–
3, 4 D_n, 1 1 1 1 1 0 3 3 0 0 0 7 F 0
–
D_n
...
Repeat pattern 1...4 until nRAS - 1; truncate if necessary
nRAS PRE 0 1 0 1 0 0 0 0 0 0 0 0 0 0
–
...
Repeat pattern 1...4 until nRC - 1; truncate if necessary
1 1 × nRC
Repeat sub-loop 0, use BG[1:0] = 1, use BA[1:0] = 1 instead
2 2 × nRC
Repeat sub-loop 0, use BG[1:0] = 0, use BA[1:0] = 2 instead
3 3 × nRC
Repeat sub-loop 0, use BG[1:0] = 1, use BA[1:0] = 3 instead
4 4 × nRC
Repeat sub-loop 0, use BG[1:0] = 0, use BA[1:0] = 1 instead
5 5 × nRC
Repeat sub-loop 0, use BG[1:0] = 1, use BA[1:0] = 2 instead
6 6 × nRC
Repeat sub-loop 0, use BG[1:0] = 0, use BA[1:0] = 3 instead
7 7 × nRC
Repeat sub-loop 0, use BG[1:0] = 1, use BA[1:0] = 0 instead
8 8 × nRC
Repeat sub-loop 0, use BG[1:0] = 2, use BA[1:0] = 0 instead⁴
9 9 × nRC
Repeat sub-loop 0, use BG[1:0] = 3, use BA[1:0] = 1 instead ⁴
10 10 × nRC
Repeat sub-loop 0, use BG[1:0] = 2, use BA[1:0] = 2 instead ⁴
11 11 × nRC
Repeat sub-loop 0, use BG[1:0] = 3, use BA[1:0] = 3 instead ⁴
12 12 × nRC
Repeat sub-loop 0, use BG[1:0] = 2, use BA[1:0] = 1 instead ⁴
13 13 × nRC
Repeat sub-loop 0, use BG[1:0] = 3, use BA[1:0] = 2 instead ⁴
14 14 × nRC
Repeat sub-loop 0, use BG[1:0] = 2, use BA[1:0] = 3 instead ⁴
15 15 × nRC
Repeat sub-loop 0, use BG[1:0] = 3, use BA[1:0] = 0 instead ⁴
Notes:
1. DQS_t, DQS_c are V_DDQ.
2. BG1 is a "Don't Care" for x16 devices.
3. DQ signals are V_DDQ.
4. For x4 and x8 only.
CCMTD-1725822587-10418
4gb_auto_ddr4_sdram_z90b.pdf - Rev. D 01/17 EN
311
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