81250 Datasheet, PDF (42/64 Pages) Keysight Technologies – Agilent ParBERT 81250 Parallel Bit Error Ratio Tester

Typical waveform pictures
Eye Plots
The 3.35 Gb/s generator
output is designed for clean and
fast output signals. It offers a
swing of 50 mV to 1.8 V within
the voltage window suited for
testing LVDS, CML, (P)ECL and
SSTL 0 - 3.3 V technologies.
Crossing Point
The 3.35 Gb/s generator allows a
variable cross-over for differential
signals. The cross-over can be
programmed by the user interface
or remote program between 30
and 70%.
Jitter Modulation Examples
A Receiver's jitter tolerance can
be tested applying a voltage at
the external delay control input
and by this generating jittered
output signals as depicted in
figure 26 a-d.
Figure 24a. 3.35 Gb/s Generator: 50 mVpp
Figure 24c. 3.35 Gb/s Generator @30%
Figure 25a. Jitter modulated with sine wave
Figure 24b. 3.35 Gb/s Generator: 1.8 V pp
Figure 24d. 3.35 Gb/s Generator @50%
Figure 25b. Jitter modulated with
rectangle wave
Figure 24e. 3.35 Gb/s Generator @70%
Figure 25c. Jitter modulated with
triangle wave
Page 42/64
Figure 25d. Jitter modulated with
noise generator
ParBERT 81250 Main Overview