81250 Datasheet, PDF (3/64 Pages) Keysight Technologies – Agilent ParBERT 81250 Parallel Bit Error Ratio Tester

Agilent ParBERT 81250 Overview
The ParBERT 81250 is the
flexible and scalable physical
layer test solution that, based
on its modular BERT engine,
enables characterization of
high-speed multi-port devices in
the computer, communications
and feeding semiconductor
industry.
The modular ParBERT 81250
can be tailored to individual
test needs with up to 132¹⁾
synchronous channels. Different
modules are available for the
ParBERT 81250 System that
cover data generation and
analysis from 333 kb/s up to
13.5 Gb/s. Once purchased in a
certain configuration ParBERT
81250 can easily be extended to
fit future needs protecting your
investment.
Broad spectrum of applications
Originally designed to test and
characterize synchronous devices
such as a Mux/Demux typical
for the communications industry
ParBERT 81250 is equally suited
for clock synchronous multi-port
and multiple serial applications
such as can be found in the
computer industry.
Powerful Pattern sequencer for
uninterrupted testing
Running complex tests with a
variety of test patterns in one shot
without stopping the instrument
for pattern download is enabled
through the powerful ParBERT
81250 pattern sequencer with
its up to five nested loop levels
and branching on external and
internal events or upon SW
command.
In-depth insight into designs
and devices
The measurement suite
automates the parameter
variation of ParBERT’s BER-
measurements to achieve and
visualize insight into the DUT’s
parametric performance, e.g.
producing eye diagrams, or doing
timing margin analysis with
BER-scan bathtub-plots with
RJ-DJ jitter decomposition. Jitter
injection via the delay control
input of the 13.5 / 7 / 3.35 Gb/s
Data Generator Modules allows
in depth receiver margining
including jitter tolerance tests.
Application support
ParBERT’s software package
contains setup and processing
tools for 10GbE and SONET/SDH.
The N5990A Test Automation
Platform enables simple
compliance test with ParBERT
for different standards such as
PCI Express®, MIPI™, display
port (DP) and HDMI.
Application and product notes
describing a variety of test
applications with ParBERT are
available for download from
www.agilent.com/find/ParBERT.
ParBERT 81250 key
characteristics:
• Modular BERT platform
for physical layer test and
characterization
• Modules of various speed
classes up to 13.5 Gb/s
• Up to 66 synchronous generator
and analyzer channels
• Powerful pattern sequencer to
control complex devices
PRBS/PRWS²⁾ and memory
based patterns
• Delay control input to apply
external jitter sources³⁾
• Integrated clock data recovery
to test clock-less interfaces⁴⁾
• Comprehensive measurement
suite
Note:
1) 66 or 30 channels max with
3.35Gb/s or 13.5Gb/s modules
2) PRWS, Pseudo Random Word
Sequence, is a special hardware
generated pattern, based on
PRBS, to test Mux/DeMux
3) 3.35 Gb/s, 7Gb/s and 13.5 Gb/s
generator modules only
4) 7 Gb/s and 13.5 Gb/s analyzer
modules only
ParBERT 81250 Main Overview
Page 3/64