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HYB25D128160CT Datasheet, PDF (69/85 Pages) Infineon Technologies AG – 128 Mbit Double Data Rate SDRAM
HYB25D128[400/800/160]C[C/E/T](L)
128 Mbit Double Data Rate SDRAM
Electrical Characteristics
Table 20 IDD Conditions
Parameter
Symbol
Operating Current 0
one bank; active/ precharge; tRC = tRC,MIN;
DQ, DM, and DQS inputs changing once per clock cycle;
address and control inputs changing once every two clock cycles.
IDD0
Operating Current 1
IDD1
one bank; active/read/precharge; Burst Length = 4; Refer to Chapter 4.3.1 for detailed test conditions.
Precharge Power-Down Standby Current
all banks idle; power-down mode; CKE ≤ VIL,MAX
Precharge Floating Standby Current
CS ≥ VIH,,MIN, all banks idle; CKE ≥ VIH,MIN;
address and other control inputs changing once per clock cycle; VIN = VREF for DQ, DQS and DM.
Precharge Quiet Standby Current
CS ≥ VIHMIN, all banks idle; CKE ≥ VIH,MIN;
address and other control inputs stable at ≥ VIH,MIN or ≤ VIL,MAX; VIN = VREF for DQ, DQS and DM.
Active Power-Down Standby Current
one bank active; power-down mode; CKE ≤ VILMAX; VIN = VREF for DQ, DQS and DM.
Active Standby Current
one bank active; CS ≥ VIH,MIN; CKE ≥ VIH,MIN; tRC = tRAS,MAX;
DQ, DM and DQS inputs changing twice per clock cycle;
address and control inputs changing once per clock cycle.
IDD2P
IDD2F
IDD2Q
IDD3P
IDD3N
Operating Current Read
one bank active; Burst Length = 2; reads; continuous burst;
address and control inputs changing once per clock cycle;
50% of data outputs changing on every clock edge;
CL = 2 for DDR266(A), CL = 3 for DDR333 and DDR400B; IOUT = 0 mA
Operating Current Write
one bank active; Burst Length = 2; writes; continuous burst;
address and control inputs changing once per clock cycle;
50% of data outputs changing on every clock edge;
CL = 2 for DDR266(A), CL = 3 for DDR333 and DDR400B
IDD4R
IDD4W
Auto-Refresh Current
tRC = tRFCMIN, burst refresh
Self-Refresh Current
CKE ≤ 0.2 V; external clock on
IDD5
IDD6
Operating Current 7
four bank interleaving with Burst Length = 4; Refer to Chapter 4.3.1 for detailed test conditions.
IDD7
Data Sheet
69
Rev. 1.0, 2004-04