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TC1762 Datasheet, PDF (112/114 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller TriCore
TC1762
Preliminary
Packaging
5.3
Flash Memory Parameters
The data retention time of the TC1762’s Flash memory (i.e. the time after which stored
data can still be retrieved) depends on the number of times the Flash memory has been
erased and programmed.
Table 5-2 Flash Parameters
Parameter
Symbol Limit Values Unit Notes
Min.
Max.
Program Flash
tRET
20
Retention Time,
Physical Sector1) 2)
–
years Max. 1000
erase/program cycles
Program Flash
Retention Time,
Logical Sector1)2)
tRETL
20
–
years Max. 50
erase/program cycles
Data Flash Endurance NE
(32 Kbyte)
15 000 –
–
Max. data retention
time 5 years
Data Flash Endurance, NE8
EEPROM Emulation
(8 × 4 Kbyte)
120 000 –
–
Max. data retention
time 5 years
Programming Time per tPR
–
Page3)
5
ms –
Program Flash Erase tERP
–
Time per 256-Kbyte
sector
5
s
fCPU = 80 MHz
Data Flash Erase Time tERD
–
per 16-Kbyte sector
0.625 s
fCPU = 80 MHz
Wake-up time
tWU
4300 × 1/fCPU + 40µs
1) Storage and inactive time included.
2) At average weighted junction temperature TJ = 100 °C, or
the retention time at average weighted temperature of TJ = 110 °C is minimum 10 years, or
the retention time at average weighted temperature of TJ = 150 °C is minimum 0.7 years.
3) In case the Program Verify feature detects weak bits, these bits will be programmed once more. The
reprogramming takes additional 5ms.
Data Sheet
108
V1.0, 2008-04