IC-JX_16 Datasheet, PDF (33/48 Pages) IC-Haus GmbH – 16-FOLD 24 V HIGH-SIDE DRIVER

iC-JX
16-FOLD 24 V HIGH-SIDE DRIVER WITH µC INTERFACE
ADC measurements
Rev C2, Page 33/48
Configure ADC-Measurement
(Control Word 5 & 6)
start A/D conversion
with EW = '1'
polling bit EW 3
3 possibilities ¹
to wait for IEOC
polling Interrupt Message Register A/B
read Control Word 6; Bit EW
2
polling pins
NINT or SOC/SOB
yes _{Bit EW is '1'?}
no
read A/D converter data
read Interrupt Message
Register A/B
no
only interrupt
IEOC set?
yes
appropriate interrupt
management
set EOI to '1'
(Control Word 4)
NINT or SOC/SOB
signal interrupt?
yes
read Interrupt Message
Register A/B
only interrupt bit
no
IEOC set?
yes
read A/D converter data
read Interrupt Message
Register A/B
any interrupts
yes
except IEOC set?
no
no
interrupt bit
IEOC set?
yes
read A/D converter data
set EOI to '1'
(Control Word 4)
appropriate interrupt
management
set EOI to '1'
(Control Word 4)
appropriate interrupt
management
Figure 7: ADC measurement
In the following the various ADC measurement features
are described which can be configured using Control
Word 6 (Addr. 0x1C, P. 23). An A/D conversion is
started by setting bit EW to 1. The end of A/D conver-
sion is reported via EOC resp. IEOC (Interrupt Status
Register, Addr. 0x05, P. 29), by a low signal ’0’ at NINT
resp. ’1’ at D1/SOC or D2/SOB. The result of the con-
version is stored as a 10 bit digital value in the registers
A/D converter data (see P. 35).
ADC measurements: measuring current
With SELAD = 0x1 the current in each output stage can
be measured. The output stage is selected via SELES
in Control Word 5 (Addr. 0x1B, P. 22).
The saturation voltage from an internal reference tran-
sistor is used for comparison. Each output stage has
its own reference transistor in order to guarantee a pre-
cise value. The reference voltage is equivalent to the
saturation voltage of the output stage transistor with a
nominal current of 150 mA; the output digital value thus
corresponds to the current intensity in the output stage.
To evaluate current variations in the output stage the
controller must perform an initial measurement with a
known reference current. Based on this value a mon-
itoring of the load current can then be performed; e.g.
failed valves and faulty or wrongly implemented indi-
cator lamps connected to IOx can be verified in this
way.
ADC measurements: measuring voltage
The iC-JX measures voltages at the I/O stages in differ-
ent ranges summarized in Tab. 10
SELAD¹ = 0x2: Voltage measurement high at IO
EME
Voltage range
0
VR1 = (VBy – 0.6 V) to VBy
1
VR2 = (VBy – 5 V) to VBy
SELAD = 0x4: Voltage measurement low at IO
EME
Voltage range
0
VR3 = 0 to 0.6 V
1
VR4 = 0 to 5 V
SELAD = 0x3: Overall voltage measurement range at IO
EME
Voltage range
-
Notes
VR5²
1 _{Control Word 6, Addr. 0x1C}
2 _{voltage of selected I/O stage 1/15 downscaled}
VBy = VB1..4
VR1..VR5 please refer to Fig. 8
Table 10: ADC measurement: voltage ranges