MC9S12P128_10 Datasheet, PDF (504/566 Pages) Freescale Semiconductor, Inc – S12 Microcontrollers

Electrical Characteristics
Model
Human Body
Latch-up
Table A-2. ESD and Latch-up Test Conditions
Description
Series resistance
Storage capacitance
Number of pulse per pin
Positive
Negative
Minimum input voltage limit
Maximum input voltage limit
Symbol
R1
C
—
—
—
—
Value
1500
100
3
3
–2.5
7.5
Unit
Ohm
pF
V
V
Num
1
2
3
4
Table A-3. ESD and Latch-Up Protection Characteristics
C
Rating
C Human Body Model (HBM)
C Charge Device Model (CDM)
C Latch-up current at T_A = 125°C
Positive
Negative
C Latch-up current at T_A = 27°C
Positive
Negative
Symbol
V_HBM
V_CDM
I_LAT
I_LAT
Min
2000
500
+100
–100
+200
–200
Max
Unit
—
V
—
V
mA
—
—
mA
—
—
A.1.7 Operating Conditions
This section describes the operating conditions of the device. Unless otherwise noted those conditions
apply to all the following data.
NOTE
Please refer to the temperature rating of the device (C, V, M) with regards to
the ambient temperature T_A and the junction temperature T_J. For power
dissipation calculations refer to Section A.1.8, “Power Dissipation and
Thermal Characteristics”.
Table A-4. Operating Conditions
Rating
I/O, regulator and analog supply voltage
Voltage difference V_DDX to V_DDA
Voltage difference V_DDR to V_DDX
Voltage difference V_SSX to V_SSA
Voltage difference V_SS3 , V_SSPLL to V_SSX
Digital logic supply voltage
Symbol
V_DD35
∆_VDDX
∆_VDDR
∆_VSSX
∆_VSS
V_DD
Min
Typ
Max
Unit
3.13
5
5.5
V
refer to Table A-14
-0.1
0
0.1
V
refer to Table A-14
-0.1
0
0.1
V
1.72
1.8
1.98
V
S12P-Family Reference Manual, Rev. 1.13
504
Freescale Semiconductor