MC9S12P128_10 Datasheet, PDF (503/566 Pages) Freescale Semiconductor, Inc – S12 Microcontrollers

Electrical Characteristics
Table A-1. Absolute Maximum Ratings⁽¹⁾
Num
Rating
Symbol
Min
1 I/O, regulator and analog supply voltage
2 Voltage difference V_DDX to V_DDA
3 Voltage difference V_SSX to V_SSA
4 Digital I/O input voltage
5 Analog reference
6 EXTAL, XTAL
7 Instantaneous maximum current
Single pin limit for all digital I/O pins⁽²⁾
V_DD35
∆_VDDX
∆_VSSX
V_IN
V_RH, V_RL
V_ILV
I_D
–0.3
–6.0
–0.3
–0.3
–0.3
–0.3
–25
8 Instantaneous maximum current
Single pin limit for EXTAL, XTAL
I_DL
–25
9 Storage temperature range
1. Beyond absolute maximum ratings device might be damaged.
Tstg
–65
2. All digital I/O pins are internally clamped to V_SSX and V_DDX, or V_SSA and V_DDA.
Max
Unit
6.0
V
0.3
V
0.3
V
6.0
V
6.0
V
2.16
V
+25
mA
+25
mA
155
°C
A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 stress test qualification for automotive grade
integrated circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
S12P-Family Reference Manual, Rev. 1.13
Freescale Semiconductor
503