908E621_12 Datasheet, PDF (16/60 Pages) Freescale Semiconductor, Inc – Integrated Quad Half bridge and Triple High Side Embedded MCU and LIN for High End Mirror

ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TIMING DIAGRAMS
LIN, L0
10k
1nF
Transient Pulse
Generator
Note: Waveform in accordance to ISO7637 part 1, test pulses 1, 2, 3a and 3b.
Figure 4. Test Circuit for Transient Test Pulses
V^VS^SU^UP^P
TXD
RXD
R0
LIN
R‚Ä0¢_R-a1₁₀n_k.0ad_OnkCdhΩ0_mCaC0anoncddm_o1m1b._nb0inFina_ati_to_ion_ns_s:_:
•_- 6₆₆0₀0 _OΩ_ha_mnd_an6_d.8_6.8nF
C0
•_- 5₅₀0₀0 _OΩ_ha_mnd_an1_d0_10nF
Figure 5. Test Circuit for LIN Timing Measurements
TXD
VLIN
LIN
RXD
tDOM-MIN
58.1% VSUP
40% VSUP
tDOM-MAX
28.4% VSUP
tREC-MAX
74.4% VSUP
60% VSUP
42.2% VSUP
tREC-MIN
tRL
tRH
Figure 6. LIN Timing Measurements for Normal Slew Rate
908E621
16
Analog Integrated Circuit Device Data
Freescale Semiconductor