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EN27LN51208 Datasheet, PDF (39/46 Pages) Eon Silicon Solution Inc. – 512 Megabit (64 M x 8) SLC, 3.3 V NAND Flash Memory
11.7 Read Status
EN27LN51208
A status register on the device is used to check whether program or erase operation is completed and
whether the operation is completed successfully. After writing 70h/F1h command to the command
register, a read cycle outputs the content of the status register to I/O pins on the falling edge of CE# or
RE#, whichever occurs last. These two commands allow the system to poll the progress of each device
in multiple memory connections even when R/B# pins are common-wired. RE# or CE# does not need to
toggle for status change.
The command register remains in Read Status mode unless other commands are issued to it. Therefore,
if the status register is read during a random read cycle, a read command (00h) is needed to start read
cycles.
Table 5. Status Register Definition for 70h Command
I/O
Page Program Block Erase
Read
Cache Read
Definition
I/O0
Pass / Fail
Pass / Fail
N/A
N/A
Pass: ”0” , Fail: ”1”
I/O1
N/A
N/A
N/A
N/A
Don’t cared
I/O2
N/A
(Pass/Fail, OTP)
N/A
N/A
N/A
Don’t cared
I/O3
N/A
N/A
N/A
N/A
Don’t cared
I/O4
N/A
N/A
N/A
N/A
Don’t cared
I/O5
N/A
N/A
N/A
True
Busy: ”0” Ready: ”1”
Ready / Busy
I/O6
Ready / Busy Ready / Busy Ready / Busy Ready / Busy Busy: ”0” Ready: ”1”
Protected: ”0”
I/O7
Write Protect
Write Protect Write Protect
Write Protect
Not Protected: ”1”
Note:
1. I/Os defined NA are recommended to be masked out when Read Status is being executed.
2. n : current page, n-1 : previous page.
11.8 Read ID
The device contains a product identification mode, initiated by writing 90h to the command register,
followed by an address input of 00h. Four read cycles sequentially output the manufacturer code (C8h),
rd th th
and the device code and 3 , 4 , 5 cycle ID respectively. The command register remains in Read ID
mode until further commands are issued to it.
Figure 31. Read ID Operation
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
©2013 Eon Silicon Solution, Inc., www.eonssi.com
Rev. A, Issue Date: 2013/09/30