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EN27LN51208 Datasheet, PDF (22/46 Pages) Eon Silicon Solution Inc. – 512 Megabit (64 M x 8) SLC, 3.3 V NAND Flash Memory
9.3 Input Data Latch Cycle
EN27LN51208
Figure 9 Input Data Latch Cycle
9.4 Serial Access Cycle after Read (CLE=L, WE#=H, ALE=L)
Figure 10. Sequential Out Cycle after Read
Note:
1. Dout transition is measured at ±200mV from steady state voltage at I/O with load.
2. tRHOH starts to be valid when frequency is lower than 33MHz.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
©2013 Eon Silicon Solution, Inc., www.eonssi.com
Rev. A, Issue Date: 2013/09/30