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EN27LN2G08 Datasheet, PDF (20/56 Pages) Eon Silicon Solution Inc. – 2 Gigabit (256M x 8), 3.3 V NAND Flash Memory
Input Data Latch Cycle
EN27LN2G08
Serial access Cycle after Read (CLE = L, ALE = L, WE# = H)
Note:
1. Dout Transition is measured at ±200mV from steady state voltage with load.
2. tRHOH starts to be valid when frequency is lower than 20MHz.
This Data Sheet may be revised by subsequent versions
20
or modifications due to changes in technical specifications.
©2013 Eon Silicon Solution, Inc., www.eonssi.com
Rev. D, Issue Date: 2013/12/13