DAC8728_14 Datasheet, PDF (2/56 Pages) Texas Instruments – Octal, 16-Bit, Low-Power, High-Voltage Output, Parallel Input DIGITAL-TO-ANALOG CONVERTER

DAC8728
SBAS466A – JUNE 2009 – REVISED NOVEMBER 2009
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
DAC8728
RELATIVE
ACCURACY
(LSB)
±4
±4
ORDERING INFORMATION⁽¹⁾
DIFFERENTIAL
LINEARITY
(LSB)
PACKAGE-
LEAD
PACKAGE
DESIGNATOR
±1
QFN-56
RTQ
±1
TQFP-64
PAG
SPECIFIED
TEMPERATURE
RANGE
–40°C to +105°C
–40°C to +105°C
PACKAGE
MARKING
DAC8728
DAC8728
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI
website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range (unless otherwise noted).
AV_DD to AV_SS
AV_DD to AGND
AV_SS to AGND, DGND
DV_DD to DGND
IOV_DD to DGND
AGND to DGND
Digital input voltage to DGND
V_OUT-x, V_MON to AV_SS
REF-A, REF-B to AGND
BUSY, GPIO to DGND
Maximum current from V_MON
Operating temperature range
Storage temperature range
Maximum junction temperature (T_J max)
Human body model (HBM)
ESD ratings
TQFP
Charged device model (CDM)
QFN
Machine model (MM)
Thermal impedance
Junction-to-ambient, θ_JA
Junction-to-case, θ_JC
TQFP
QFN
TQFP
QFN
Power dissipation
DAC8728
–0.3 to 38
–0.3 to 38
–19 to 0.3
–0.3 to 6
–0.3 to DV_DD + 0.3
–0.3 to 0.3
–0.3 to IOV_DD + 0.3
–0.3 to AV_DD + 0.3
–0.3 to DV_DD
–0.3 to IOV_DD + 0.3
3
–40 to +105
–65 to +150
+150
4
1000
500
200
55
21.7
21
20.4
(T_J max – T_A) / θ_JA
UNIT
V
V
V
V
V
V
V
V
V
V
mA
°C
°C
°C
kV
V
V
V
°C/W
°C/W
°C/W
°C/W
W
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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