RX110_16 Datasheet, PDF (85/108 Pages) Renesas Technology Corp – 32 MHz 32-bit RX MCUs, 50 DMIPS

RX110 Group
5. Electrical Characteristics
Table 5.36 A/D Conversion Characteristics (2)
Conditions: 2.4 V ≤ VCC ≤ 3.6 V, 2.4 V ≤ AVCC0 ≤ 3.6 V, 2.4 V ≤ VREFH0 ≤ AVCC0, VSS = AVSS0 = VREFL0 = 0 V,
T_a = –40 to +105°C
Item
Min.
Typ.
Max.
Unit
Test Conditions
Frequency
4
—
16
MHz
Resolution
—
—
12
Bit
Conversion time*¹
Permissible signal source
2.062
—
—
µs
High-precision channel
(Operation at
impedance (Max.) = 1.0 kΩ
(0.625)*²
ADCSR.ADHSC bit = 1
PCLKD = 16 MHz)
ADSSTRn.SST[7:0] bits = 09h
2.750
—
—
µs
Normal-precision channel
(1.313)*²
ADCSR.ADHSC bit = 1
ADSSTRn.SST[7:0] bits = 14h
Analog input effective range
0
—
VREFH0
V
Offset error
—
±0.5
±6.0
LSB
Full-scale error
—
±1.25
±6.0
LSB
Quantization error
—
±0.5
—
LSB
Absolute accuracy
—
±3.0
±8.0
LSB
DNL differential nonlinearity error
—
±1.0
—
LSB
INL integral nonlinearity error
—
±1.5
±3.0
LSB
Note:
Note 1.
Note 2.
The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential nonlinearity error, and INL integral nonlinearity error do not
include quantization errors.
The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
The value in parentheses indicates the sampling time.
Table 5.37 A/D Conversion Characteristics (3)
Conditions: 1.8 V ≤ VCC ≤ 3.6 V, 1.8 V ≤ AVCC0 ≤ 3.6 V, 1.8 V ≤ VREFH0 ≤ AVCC0, VSS = AVSS0 = VREFL0 = 0 V,
T_a = –40 to +105°C
Item
Min.
Typ.
Max.
Unit
Test Conditions
Frequency
1
—
8
MHz
Resolution
—
—
12
Bit
Conversion time*¹
Permissible signal source
4.875
—
—
µs
High-precision channel
(Operation at
impedance (Max.) = 5.0 kΩ
(1.250)*²
ADCSR.ADHSC bit = 0
PCLKD = 8 MHz)
ADSSTRn.SST[7:0] bits = 09h
6.250
—
—
(2.625)*²
Normal-precision channel
ADCSR.ADHSC bit = 0
ADSSTRn.SST[7:0] bits = 14h
Analog input effective range
0
—
VREFH0
V
Offset error
—
±0.5
±24.0
LSB
Full-scale error
—
±1.25
±24.0
LSB
Quantization error
—
±0.5
—
LSB
Absolute accuracy
—
±2.75
±32.0
LSB
DNL differential nonlinearity error
—
±1.0
—
LSB
INL integral nonlinearity error
—
±1.25
±12.0
LSB
Note:
Note 1.
Note 2.
The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential nonlinearity error, and INL integral nonlinearity error do not
include quantization errors.
The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
The value in parentheses indicates the sampling time.
R01DS0202EJ0120 Rev.1.20
Jul 29, 2016
Page 85 of 108