PC87591L-N05 Datasheet, PDF (356/401 Pages) National Semiconductor (TI) – LPC Mobile Embedded Controller

7.0 Device Specifications (Continued)
Symbol
t_BUFo
t_CSTOso
t_CSTRho
t_CSTRso
t_DHCso
t_DLCso
t_SCLfo
t_SCLro
t_SDAfo
t_SDAro
Figure
Description
Reference Conditions
140
Bus free time between Stop
and Start conditions
140
SCL setup time
Before Stop condition
140, 141 SCL hold time
After Start condition
141
SCL setup time
Before Start condition
141
Data high setup time
Before SCL RE
140
Data low setup time
Before SCL RE
139
SCL signal fall time
139
SCL signal rise time
139
SDA signal fall time
139
SDA signal rise time
Min
t_SCLhigho
t_SCLhigho
t_SCLhigho
t_SCLhigho
t_SCLhigho
− t_SDAro
t_SCLhigho
− t_SDAfo
t_SDAho
t_SDAvo
142
SDA hold time
142
SDA valid time
After SCL FE
After SCL FE
7 _* t_CLK −
t_SCLfo
1. Test conditions: R_L = 2.2 KΩ to V_CC = 3.3V, C_L = 400 pF to GND.
2. Not tested; guaranteed by design.
3. Not tested; guaranteed by characterization.
4. Depends on the signal’s capacitance and the pull-up value. Must be less than 1 µs.
Max
300^1,3
See note⁴
300
See
note^1,3,4
7 _* t_CLK +
t_SDAro
Unit
-
-
-
-
-
-
ns
ns
-
-
-
In Figure 139 through Figure 142, an “o” is added to parameter names in the timing tables for output signals and an “i” for
input signals, as displayed in the preceding table:
SDA
0.7 V_CC
0.3 V_CC
t_SDAro
t_SDAri
0.7 V_CC
0.3 V_CC
t_SDAfo
t_SDAfi
SCL
0.7 V_CC
0.3 V_CC
t_SCLro
t_SCLri
0.7 V_CC
0.3 V_CC
t_SCLfo
t_SCLfi
Figure 139. ACB Signals (SDA and SCL) Rising Time and Falling Time
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