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PIC24HJ32GP302_11 Datasheet, PDF (337/368 Pages) Microchip Technology – High-Performance, 16-bit Microcontrollers | |||
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PIC24HJ32GP302/304, PIC24HJ64GPX02/X04 AND PIC24HJ128GPX02/X04
TABLE 29-14: ADC MODULE SPECIFICATIONS
AC
Standard Operating Conditions: 3.0V to 3.6V (unless otherwise stated)
CHARACTERISTICS Operating temperature -40°C ⤠TA ⤠+150°C for High Temperature
Param
No.
Symbol
Characteristic
Min Typ Max Units
Conditions
HAD08
Note 1:
2:
Reference Inputs
IREF
Current Drain
â 250 600 μA ADC operating, See Note 1
â
â
50 μA ADC off, See Note 1
These parameters are not characterized or tested in manufacturing.
These parameters are characterized, but are not tested in manufacturing.
TABLE 29-15: ADC MODULE SPECIFICATIONS (12-BIT MODE)
AC
Standard Operating Conditions: 3.0V to 3.6V (unless otherwise stated)
CHARACTERISTICS Operating temperature -40°C ⤠TA ⤠+150°C for High Temperature
Param
No.
HAD20a
HAD21a
HAD22a
HAD23a
HAD24a
HAD20a
HAD21a
HAD22a
HAD23a
HAD24a
HAD33a
Note 1:
2:
3:
Symbol
Characteristic
Min Typ Max Units
Conditions
ADC Accuracy (12-bit Mode) â Measurements with External VREF+/VREF-(1)
Nr
Resolution(3)
12 data bits
bits
â
INL
Integral Nonlinearity
-2
â
+2
LSb VINL = AVSS = VREFL = 0V,
AVDD = VREFH = 3.6V
DNL
Differential Nonlinearity > -1 â
< 1 LSb VINL = AVSS = VREFL = 0V,
AVDD = VREFH = 3.6V
GERR
Gain Error
-2
â
10
LSb VINL = AVSS = VREFL = 0V,
AVDD = VREFH = 3.6V
EOFF
Nr
Offset Error
-3
â
5
LSb VINL = AVSS = VREFL = 0V,
AVDD = VREFH = 3.6V
ADC Accuracy (12-bit Mode) â Measurements with Internal VREF+/VREF-(1)
Resolution(3)
12 data bits
bits
â
INL
Integral Nonlinearity
-2
â
+2
LSb VINL = AVSS = 0V, AVDD = 3.6V
DNL
Differential Nonlinearity > -1 â
< 1 LSb VINL = AVSS = 0V, AVDD = 3.6V
GERR
Gain Error
2
â
20
LSb VINL = AVSS = 0V, AVDD = 3.6V
EOFF
Offset Error
2
â
10
LSb VINL = AVSS = 0V, AVDD = 3.6V
Dynamic Performance (12-bit Mode)(2)
FNYQ
Input Signal Bandwidth â
â
200 kHz
â
These parameters are characterized, but are tested at 20 ksps only.
These parameters are characterized by similarity, but are not tested in manufacturing.
Injection currents > | 0 | can affect the ADC results by approximately 4-6 counts.
© 2011 Microchip Technology Inc.
DS70293E-page 337
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