PIC16F870_13 Datasheet, PDF (122/172 Pages) Microchip Technology – 28/40-Pin, 8-Bit CMOS FLASH Microcontrollers

PIC16F870/871
14.2 DC Characteristics: PIC16F870/871 (Industrial) (Continued)
DC CHARACTERISTICS
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C  TA  +85°C for Industrial
Operating voltage VDD range as described in DC spec Section 14.1
and Section 14.2.
Param
No.
Sym
Characteristic
Min Typ† Max Units
Conditions
VOL Output Low Voltage
D080
I/O ports
—
— 0.6
V IOL = 8.5 mA, VDD = 4.5V,
-40C to +85C
D083
OSC2/CLKO (RC osc config)
—
— 0.6
V IOL = 1.6 mA, VDD = 4.5V,
-40C to +85C
VOH Output High Voltage
D090
I/O ports (Note 3)
VDD – 0.7 —
—
V IOH = -3.0 mA, VDD = 4.5V,
-40C to +85C
D092
OSC2/CLKO (RC osc config) VDD – 0.7 —
—
V IOH = -1.3 mA, VDD = 4.5V,
-40C to +85C
D150* VOD Open Drain High Voltage
—
— 8.5
V RA4 pin
Capacitive Loading Specs
on Output Pins
D100 COSC2 OSC2 pin
—
—
15
pF In XT, HS and LP modes when
external clock is used to drive
OSC1.
D101 CIO All I/O pins and OSC2
(in RC mode)
D102 CB _{SCL, SDA in I}²_{C mode}
—
—
50
pF
—
— 400 pF
Data EEPROM Memory
D120 ED Endurance
100K
—
— E/W 25C at 5V
D121 VDRW VDD for read/write
VMIN
— 5.5
V Using EECON to read/write
VMIN = min operating voltage
D122 TDEW Erase/write cycle time
—
4
8
ms
Program FLASH Memory
D130 EP Endurance
1000
—
— E/W 25C at 5V
D131 VPR VDD for read
VMIN
— 5.5
V VMIN = min operating voltage
D132a
VDD for erase/write
VMIN
— 5.5
V Using EECON to read/write,
VMIN = min operating voltage
D133 TPEW Erase/Write cycle time
—
4
8
ms
* These parameters are characterized but not tested.
† Data in "Typ" column is at 5V, 25°C unless otherwise stated. These parameters are for design guidance
only and are not tested.
Note 1: In RC oscillator configuration, the OSC1/CLKI pin is a Schmitt Trigger input. It is not recommended that the
PIC16F870/871 be driven with external clock in RC mode.
2: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified
levels represent normal operating conditions. Higher leakage current may be measured at different input
voltages.
3: Negative current is defined as current sourced by the pin.
DS30569C-page 122
 2000-2013 Microchip Technology Inc.