DD28F032SA Datasheet, PDF (22/49 Pages) Intel Corporation – 32-MBIT (2 MBIT X 16, 4 MBIT X 8) FlashFile MEMORY

DD28F032SA
E
2.4
2.0
INPUT
TEST POINTS
2.0
OUTPUT
0.8
0.8
0.45
0490_06
AC test inputs are driven at V_OH (2.4 VTTL) for a Logic “1” and V_OL (0.45 VTTL) for a Logic “0.” Input timing begins at V_IH
(2.0 VTTL) and V_IL (0.8 VTTL). Output timing ends at V_IH and V_IL. Input rise and fall times (10% to 90%) <10 ns.
Figure 6. Transient Input/Output Reference Waveform (V_CC = 5.0V) for Standard Test Configuration⁽¹⁾
3.0
INPUT
1.5
TEST POINTS
1.5 OUTPUT
0.0
0490_07
AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.
Input rise and fall times (10% to 90%) <10 ns.
Figure 7. Transient Input/Output Reference Waveform (V_CC = 3.3V)
and High Speed Reference Waveform ⁽²⁾ (V_CC = 5.0V ± 5%)
NOTES:
1. Testing characteristics for DD28F032SA-080/DD28F032SA-100.
2. Testing characteristics for DD28F032SA-070/DD28F032SA-150.
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