XC2288H_11 Datasheet, PDF (105/151 Pages) Infineon Technologies AG – 16/32-Bit Single-Chip Microcontroller with 32-Bit Performance

XC2288H, XC2289H
XC2000 Family / High Line
Electrical Parameters
Table 20 ADC Parameters (cont’d)
Parameter
Broken wire detection
delay against VAGND¹⁾
Broken wire detection
delay against VAREF¹⁾
Symbol
Min.
t_BWG CC −
Values
Typ. Max.
−
50²⁾
Unit Note /
Test Condition
t_BWR CC −
−
50³⁾
Conversion time for 8-bit t_c8 CC (11 + −
−
result¹⁾
STC) x
t_ADCI +
2x
t_SYS
Conversion time for 10-bit t_c10 CC (13 + −
−
result¹⁾
STC) x
t_ADCI +
2x
t_SYS
Total Unadjusted Error |TUE| −
1
2
LSB
4)
CC
Wakeup time from analog t_WAF CC −
−
4
μs
powerdown, fast mode
Wakeup time from analog t_WAS CC −
−
15
μs
powerdown, slow mode
Analog reference ground V_AGND V_SS - −
SR
0.05
1.5 V
Analog input voltage
V_AIN SR V_AGND −
V_AREF V
5)
range
Analog reference voltage V_AREF
SR
V_AGND −
+ 1.0
V_DDPA V
+ 0.05
1) This parameter includes the sample time (also the additional sample time specified by STC), the time to
determine the digital result and the time to load the result register with the conversion result. Values for the
basic clock t_ADCI depend on programming.
2) The broken wire detection delay against V_AGND is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 500 μs. Result below 10% (66_H)
3) The broken wire detection delay against V_AREF is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 10 μs. This function is influenced by leakage current, in particular at high
temperature. Result above 80% (332_H)
Data Sheet
105
V1.3, 2011-07